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UMBC Nanoimaging Facility (NIF)

The Nanoimaging Facility (NIF) offers high-resolution imaging equipment for researchers at UMBC and from other academic institutions, government laboratories and industry in the surrounding area. Usage is on a fee basis and technical help will be offered.

The currently available instruments are:

  • JEOL 5600 Scanning Electron Microscope, equipped for secondary electron and back-scattered electron imaging and X-ray elemental analysis.
  • Dimension 3100 Atomic Force Microscope for imaging hard and soft surfaces in contact and tapping modes and for the manipulation of objects on the nanometer scale.

A Nova NanoSEM 450 Field Emission Scanning Electron Microscope manufactured by FEI will be added in 2014, thanks to an NSF Major Research Instrumentation grant. The instrument will be capable of nanometer resolution in both high and low vacuum, using a variety of detectors.

Contact for more information and rates: Dr. Laszlo Takacs, Department of Physics, 410-455-2524,